Measurement of the Adhesion Force between Carbon Nanotubes and a Silicon Dioxide Substrate
nanotube, adhesion force, atomic force, slippage, silicon dioxide layer
Carbon nanotube adhesion force measurements were performed on single-walled nanotubes grown over lithographically defined trenches. An applied vertical force from an atomic force microscope (AFM), in force distance mode, caused the tubes to slip across the 250-nm-wide silicon dioxide trench tops at an axial tension of 8 nN. The nanotubes slipped at an axial tension of 10 nN after being selectively coated with a silicon dioxide layer.
Copyright © 2011 American Chemical Society
Whittaker, Jed D., Ethan D. Minot, David M. Tanenbaum, Paul L. McEuen, and, Robert C. Davis. "Measurement of the Adhesion Force between Carbon Nanotubes and a Silicon Dioxide Substrate," in Nano Letters 2006 6 (5), 953-957. DOI: 10.1021/nl060018t