Title

Measurement of the Adhesion Force between Carbon Nanotubes and a Silicon Dioxide Substrate

Document Type

Article

Department

Physics (Pomona)

Publication Date

4-2006

Keywords

nanotube, adhesion force, atomic force, slippage, silicon dioxide layer

Abstract

Carbon nanotube adhesion force measurements were performed on single-walled nanotubes grown over lithographically defined trenches. An applied vertical force from an atomic force microscope (AFM), in force distance mode, caused the tubes to slip across the 250-nm-wide silicon dioxide trench tops at an axial tension of 8 nN. The nanotubes slipped at an axial tension of 10 nN after being selectively coated with a silicon dioxide layer.

Rights Information

Copyright © 2011 American Chemical Society

 
 
 
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