Voltage pulses to a scanning tunneling microscope (STM) are used to construct silicon columns of 30–100 Å diameter and up to 200 Å height on a silicon surface and on the end of a tungsten probe. These nanocolumns have excellent conductivity and longevity, and they provide an exceptional new ability to measure the shapes of nanostructures with a STM. This construction methodology and these slender yet robust columns provide a basis for nanoscale physics, lithography, and technology.
© 1992 David M. Tanenbaum
The following article appeared in "Construction of silicon nanocolumns with the scanning tunneling microscope," R. M. Ostrom, D. M. Tanenbaum, and Alan Gallagher, Appl. Phys. Lett. 61, 925 (1992), DOI:10.1063/1.107730 and may be found at http://link.aip.org/link/?APPLAB/61/925/1