Document Type

Article

Department

Physics (Pomona)

Publication Date

1-1-1992

Keywords

Physics; Silicon; Scanning tunneling microscopy (STM); Machining; Surface structure; Microstructure; Aspect ratio; Modifications; Surface forces; Dipole interactions

Abstract

Voltage pulses to a scanning tunneling microscope (STM) are used to construct silicon columns of 30–100 Å diameter and up to 200 Å height on a silicon surface and on the end of a tungsten probe. These nanocolumns have excellent conductivity and longevity, and they provide an exceptional new ability to measure the shapes of nanostructures with a STM. This construction methodology and these slender yet robust columns provide a basis for nanoscale physics, lithography, and technology.

Comments

Previously linked to as: http://ccdl.libraries.claremont.edu/u?/irw,220

Rights Information

© 1992 David M. Tanenbaum

Terms of Use & License Information

Terms of Use for work posted in Scholarship@Claremont.

Share

COinS
 
 
 
/