Student Co-author

HMC Undergraduate

Document Type

Article

Department

Physics (HMC)

Publication Date

10-2001

Abstract

We report measurements of third-harmonic generation from ultrathin crystalline silicon layers of gradually varying thickness. Both the angular and thickness dependence of the third-harmonic light generated in transmission at normal incidence are consistent with negligible surface contribution to third-harmonic generation in silicon, even under tight focusing. This work illustrates a method for distinguishing surface and bulk contributions to harmonic generation.

Comments

This article is also available from the American Institute of Physics at http://dx.doi.org/10.1063/1.1412434.

Rights Information

© 2001 American Institute of Physics

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